As the strobe fires, the embedded detector circuit produces a digital pulse which is captured by the data acquisition board. The time between consecutive pulses is measured and compared to acceptable, operator-set values. Any pulses outside of these values signify an erratic strobe pattern and cause the test to fail. The test time can be adjusted by the operator, and each bad pulse is logged to file for report generation. The embedded detector device has an additional test mode, in which it produces accurately spaced pulses to simulate an ideal strobe light. This is useful for setting up, calibrating, and debugging the system.